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Sasaki, K., Hirayama, K., Endo, K., Muramatsu, M., Murayama, M., “Nanoscale Defect Evaluation Framework Combining Real-Time Transmission Electron Microscopy and Integrated Machine Learning-Particle Filter Estimation”, Scientific Reports, Vol. 12, pp. 10525, 1-10, (2022).https://doi.org/10.1038/s41598-022-13878-8

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Address
Yagami Campus 25-214, 3-14-1 Hiyoshi, Kohoku-ku, Yokohama, Kanagawa 223-8522, Japan15-minute walk from Hiyoshi Station
E-mail
muramatsu[a]mech.keio.ac.jp (Please replace [a] to @)
Extention
42023

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